0
RESEARCH PAPERS

Surface Roughness Effects in an EHL Line Contact

[+] Author and Article Information
C. H. Venner, W. E. ten Napel

University of Twente, Enschede, the Netherlands

J. Tribol 114(3), 616-622 (Jul 01, 1992) (7 pages) doi:10.1115/1.2920926 History: Received March 25, 1991; Revised September 01, 1991; Online June 05, 2008

Abstract

In this paper the influence of surface roughness on the pressure profile and film thickness in a steady state EHL line contact is investigated using input from an actually measured roughness profile in the calculations. Pressure profiles and film shapes for different load conditions are shown. The presented results strongly indicate that in the steady state situation considered here a significant deformation of the roughness profile occurs. As a result the often used λ parameter being the ratio of film thickness and standard deviation of the roughness (h/σ) with σ based on the undeformed roughness profile may give misleading information as far as the effect of the roughness on pressure and film shape is concerned.

Copyright © 1992 by The American Society of Mechanical Engineers
Your Session has timed out. Please sign back in to continue.

References

Figures

Tables

Errata

Discussions

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related Journal Articles
Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In