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RESEARCH PAPERS

A Transient EHL Analysis for Line Contacts With Measured Surface Roughness Using Multigrid Technique

[+] Author and Article Information
Xiaolan Ai, Herbert S. Cheng

Center for Engineering Tribology, Northwestern University, Evanston, IL 60208-3010

J. Tribol 116(3), 549-556 (Jul 01, 1994) (8 pages) doi:10.1115/1.2928879 History: Received March 11, 1993; Revised July 19, 1993; Online June 05, 2008

Abstract

Transient EHL analysis for line contacts with measured surface roughness is performed by using the multigrid method. Results show that the transient effect, induced by surface roughness, has a remarkable influence on pressure distribution and the film thickness profile. Pressure fluctuation increases with the relative sliding speed between the contact surfaces. For simple sliding with stationary surface roughness, the roughness profile is almost flattened. When the rough surface moves, the elastically deformed surface roughness, in the contact zone, increases with the moving speed. As the moving speed of surface roughness equals to or exceeds the rolling speed, the roughness of the deformed surface profile in the contact zone is close to the roughness of the undeformed roughness profile.

Copyright © 1994 by The American Society of Mechanical Engineers
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