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RESEARCH PAPERS

Optical Surface Analysis of the Head-Disk-Interface of Thin Film Disks

[+] Author and Article Information
Steven W. Meeks, Walter E. Weresin, Hal J. Rosen

IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, CA 95120-6099

J. Tribol 117(1), 112-118 (Jan 01, 1995) (7 pages) doi:10.1115/1.2830584 History: Received April 05, 1994; Revised June 27, 1994; Online January 24, 2008

Abstract

This paper describes the design, operation, theory, and data interpretation of an Optical Surface Analyzer (OSA). The OSA can measure carbon wear, lubricant depletion/accumulation, surface roughness, and lubricant alteration on carbon coated thin film disks. This device can measure an Angstrom of carbon wear or lubricant depletion/accumulation. The OSA can also measure debris generation and lubricant degradation through a measurement of optical index change. The lateral resolution of the OSA is approximately 5 by 10 microns and the bandwidth of the device is 2 MHz. The small device size allows it to be used within a test stand environment.

Copyright © 1995 by The American Society of Mechanical Engineers
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