Pressure Perturbation in EHD Contacts Due to an Ellipsoidal Asperity

[+] Author and Article Information
L. S. H. Chow

Argonne National Laboratory, Argonne, Ill.

H. S. Cheng

Department of Mechanical Engineering, Northwestern University, Evanston, Ill.

J. of Lubrication Tech 98(1), 8-15 (Jan 01, 1976) (8 pages) doi:10.1115/1.3452787 History: Received June 11, 1975; Online October 20, 2010


The pressure fluctuations around an ellipsoidal asperity tip at the inlet region of an elastohydrodynamic contact is determined by solving a perturbed Reynolds equation assuming that the asperity shape is unaffected by the perturbed pressure. Results are presented as the amplitude of the perturbed pressure as a function of ellipticity ratio, maximum Hertzian pressure, nominal EHD film thickness, asperity size, asperity height, and pressure viscosity coefficient. For the case of simple sliding between a smooth surface and a stationary asperity, a comparison is also made between the results for large ellipticity ratios and the pressure fluctuations obtained by using a previous line contact EHD analysis [6] for a two-dimensional asperity ridge. The agreement is found to be close for moderate Hertzian pressure and relatively thick EHD film thickness.

Copyright © 1976 by ASME
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