EHD Film Thickness in Non-Steady State Contacts

[+] Author and Article Information
J. Sugimura

Department of Energy and Mechanical Engineering, Kyushu University, Hakozaki, Higashi-ku, Fukuoka 812-81, Japan

W. R. Jones

NASA Lewis Research Center, Cleveland, OH 44135

H. A. Spikes

Tribology Section, Imperial College, Exhibition Road, London SW7 2BX, United Kingdom

J. Tribol 120(3), 442-452 (Jul 01, 1998) (11 pages) doi:10.1115/1.2834569 History: Received December 03, 1996; Revised July 17, 1997; Online January 30, 2008


This paper describes a study of EHD film thickness in non-steady state contact conditions. A modification of ultrathin film interferometry is employed which is able to measure both central film thickness and film thickness profiles 50 times a second. Film thickness with two perfluoropolyethers and two mineral base oils are investigated in a number of different types of non-steady state motion, including acceleration/deceleration, stop/start and reciprocation. The results demonstrate a range of transient behaviors of EHD film whose thicknesses deviate from those in steady state conditions.

Copyright © 1998 by The American Society of Mechanical Engineers
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