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TECHNICAL PAPERS

A Fast and Accurate Method for Numerical Analysis of Elastic Layered Contacts

[+] Author and Article Information
I. A. Polonsky, L. M. Keer

Department of Civil Engineering, Northwestern University, Evanston, IL 60208-3109

J. Tribol 122(1), 30-35 (Mar 17, 1999) (6 pages) doi:10.1115/1.555323 History: Received December 08, 1998; Revised March 17, 1999
Copyright © 2000 by ASME
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References

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Figures

Grahic Jump Location
Relative errors in the contact pressure (diamonds) and the subsurface Mises stress (squares) versus the number of grid rows per contact length for FFT/PC (filled dots) and FFT (empty dots). The curves ε=(M*)−3/2 (solid line) and ε=(M*)−2 (dashed line) are also shown.
Grahic Jump Location
Relative errors in the contact pressure (diamonds) and the subsurface Mises stress (squares) versus the relative layer thickness for E2/E1=2 (filled dots) and E2/E1=1/2 (empty dots)
Grahic Jump Location
Mises stress distribution in the plane x=0 for a rough contact with h=20 μm and E2/E1=2
Grahic Jump Location
Maximum Mises stress in the substrate versus the layer thickness for rough contacts with E2/E1=2 (diamonds) and E2/E1=1/2 (squares). The corresponding Hertzian stress is also shown (horizontal line).

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