Fast Methods for Solving Rough Contact Problems: A Comparative Study

[+] Author and Article Information
I. A. Polonsky, L. M. Keer

Department of Civil Engineering, Northwestern University, Evanston, IL 60208-3109

J. Tribol 122(1), 36-41 (Apr 20, 1999) (6 pages) doi:10.1115/1.555326 History: Received October 09, 1998; Revised April 20, 1999
Copyright © 2000 by ASME
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Grahic Jump Location
Relative error versus the number of grid rows per contact length, for MLMS (filled symbols) and FFT (empty symbols). The errors in both the contact pressure (diamonds) and the subsurface Mises stress (squares) are shown. The curves ε=2(M*)−3/2 (solid line) and ε=2(M*)−2 (dashed line) are also shown for comparison.
Grahic Jump Location
Relative error in the subsurface Mises stress versus normalized depth for MLMS (filled squares) and FFT (empty squares)
Grahic Jump Location
Relative error (a) and CPU time (b) versus normalized grid length for FFT (empty symbols) and MLMS (filled symbols). The errors in both the contact pressure (diamonds) and the subsurface Mises stress (squares) are shown in Fig. 3(a).
Grahic Jump Location
CPU time versus the number of grid rows per contact length, for MLMS with fixed parameters (filled triangles) and FFT with L/(2R)≈2 (empty triangles).




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