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TECHNICAL PAPERS

High Spatial Resolutive Method Observing the Lubricant Distribution on Magnetic Recording Media

[+] Author and Article Information
Akiyasu Kumagai, Hitoshi Orikasa

Fuji Electric Corporate Research and Development. Ltd., Material Science and Technology Laboratory, 2-2-1 Nagasaka, Yokosuka, Kanagawa, 240-0194, Japan

Nobuyuki Takahashi

Fuji Electric Storage Device Co. Ltd., Research & Development Department, 4-18-1 Tsukama, Matsumoto, Nagano, 390-0821, Japan

Osamu Ishiwata

Fuji Electric Corporate Research and Development. Ltd., Material Science and Technology Laboratory

J. Tribol 122(4), 776-779 (Jun 08, 2000) (4 pages) doi:10.1115/1.1310560 History: Received September 02, 1999; Revised June 08, 2000
Copyright © 2000 by ASME
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References

Hinkel,  H., Kuenzel,  U., Schrader,  M., Steiner,  W., and Weiss,  H., 1984, “Method of Detecting the Lubricant Distribution on Magnetic Recording Media,” IBM Tech. Discl. Bull., 26, p. 4839.
Kumagai,  A., Harada,  K., Ozawa,  K., and Ishiwata,  O., 1996, “Evaluation of Tribological Properties of a Longitudinal Magnetic Recording Medium using Lateral Modulation Friction Force Microscope,” Jpn. J. Appl. Phys., Part 1, 35, pp. 6286–6291.
Frisbie,  C. D., Rozsnyai,  L. F., Noy,  A., Wrighton,  M. S., and Lieber,  C. M., 1994, “Functional Group Imaging by Chemical Force Microscopy,” Science, 265, pp. 2071–2074.
Mate,  C. M., Lorenz,  M. R., and Novotny,  V. J., 1989, “Atomic Force Microscopy of Polymeric Liquid Films,” J. Chem. Phys., 90, pp. 7550–7555.
Mate,  C. M., 1995, “Force Microscopy Studies of the Molecular Origins of Friction and Lubrication,” IBM J. Res. Dev., 39, pp. 617–627.
Binggeli,  M., and Mate,  C. M., 1995, “Influence of Water Vapor on Nanotribology Studied by Friction Force Microscopy,” J. Vac. Sci. Technol. B, 13, pp. 1312–1315.
Perry,  S. S., Mate,  C. M., White,  R. L., and Somorjai,  G. A., 1996, “Bonding and Tribological Properties of Perfluorinated Lubricants and Hydrogenated Amorphous Carbon Films,” IEEE Trans. Magn., 32, pp. 115–121.
Martin,  Y., Williams,  C. C., and Wickramasinghe,  H. K., 1987, “Atomic Force Microscope-Force Mapping and Profiling on a sub 100-Å scale,” J. Appl. Phys., 61, pp. 4273–4279.
Weisenhorn,  A. L., Hansma,  P. K., Albrecht,  T. R., and Quate,  C. F., 1987, “Forces in Atomic Force Microscopy in Air and Water,” Appl. Phys. Lett., 54, pp. 2651–2653.  

Figures

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Schematic drawings of oscillating tip behavior at low (a) and high (b) lube thickness points
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Example of DFM-phase mode images (a) and its phase lag histogram (b)
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Cantilever amplitude dependence on the “hole” area ratio of samples having mean lube thicknesses of 1.2 (circle), 1.7 (rectangle), 2.1 (triangle), and 2.5 (diamond) nm
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Comparison between the lubricant amount measured by DFM and mean lubricant thickness by FT-IR
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Lubricant distribution on a hard disk (a) and AFM image at the same area (b). The 1.7 nm-lubricated sample was observed.
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1st (a), 10th (b), and 35th (c) binarized phase lag images in repeated observation. The 1.7 nm-lubricated sample was used.

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