Elastic-Plastic Finite Element Analysis for the Head-Disk Interface With Fractal Topography Description

K. Komvopoulos; N. Ye

doi:10.1115/1.1467088

Journal of Tribology | Volume 124 | Issue 4 | TECHNICAL PAPERS

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TECHNICAL PAPERS

Elastic-Plastic Finite Element Analysis for the Head-Disk Interface With Fractal Topography Description

K. Komvopoulos, Professor, Fellow ASME and N. Ye, Graduate Student

[+] Author and Article Information

K. Komvopoulos, N. Ye

Department of Mechanical Engineering, University of California, Berkeley, CA 94720

J. Tribol 124(4), 775-784 (Sep 24, 2002) (10 pages) doi:10.1115/1.1467088 History: Received July 05, 2001; Revised October 30, 2001; Online September 24, 2002

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(a) Surface profile equivalent to the head-disk interface truncated by a rigid plane to a maximum global interference δ_g revealing contact at different regions and (b) profile region between x=3340 nm and x=3540 nm truncated by a rigid plane to a maximum local interference δ used in the finite element simulations

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Finite element mesh of a layered medium with a 10 nm thick overcoat

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Evolution of contact pressure distributions at different regions of the surface profile shown in Fig. 1(a) with increasing surface interference for t=2 nm,E₁/E₂=0.88, and σ_Y1/σ_Y2=2.12

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Contours of (a), (c) von Mises equivalent stress and (b), (d) equivalent plastic strain for δ=0.5 nm, t=2 nm,E₁/E₂=0.88, and σ_Y1/σ_Y2=2.12

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Contours of (a), (c) von Mises equivalent stress and (b), (d) equivalent plastic strain for δ=1 nm, t=2 nm,E₁/E₂=0.88, and σ_Y1/σ_Y2=2.12

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Contours of (a), (c) von Mises equivalent stress and (b), (d) equivalent plastic strain for δ=2 nm, t=2 nm,E₁/E₂=0.88, and σ_Y1/σ_Y2=2.12

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Contours of (a), (c) von Mises equivalent stress and (b), (d) equivalent plastic strain for δ=2 nm, t=5 nm,E₁/E₂=0.88, and σ_Y1/σ_Y2=2.12

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Contours of (a), (c) von Mises equivalent stress and (b), (d) equivalent plastic strain for δ=2 nm, t=10 nm,E₁/E₂=0.88, and σ_Y1/σ_Y2=2.12

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Variation of (a) maximum von Mises equivalent stress, σ̄_M^max, (b) maximum equivalent plastic strain, ε̄_p^max, and (c) maximum first principal stress, σ₁^max, with maximum local surface interference δ in the overcoat medium for t=2, 5, and 10 nm, E₁/E₂=0.88, and σ_Y1/σ_Y2=2.12. (Stress results have been normalized by the yield strength of the overcoat, σ_Y1.)

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Variation of (a) maximum von Mises equivalent stress, σ̄_M^max, (b) maximum equivalent plastic strain, ε̄_p^max, and (c) maximum first principal stress, σ₁^max, with maximum local surface interference δ in the magnetic layer medium for t=2, 5, and 10 nm, E₁/E₂=0.88, and σ_Y1/σ_Y2=2.12. (Stress results have been normalized by the yield strength of the magnetic layer, σ_Y2.)

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Contours of (a), (c) von Mises equivalent stress and (b), (d) equivalent plastic strain for δ=2 nm, t=5 nm,E₁/E₂=1.29, and σ_Y1/σ_Y2=4.87

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Variation of (a) maximum von Mises equivalent stress, σ̄_M^max, (b) maximum equivalent plastic strain, ε̄_p^max, and (c) maximum first principal stress, σ₁^max, with maximum local surface interference δ in the overcoat and magnetic layer media for t=5 nm, β=2.1 (E₁/E₂=0.88,σ_Y1/σ_Y2=2.1), and β=4.9 (E₁/E₂=1.29,σ_Y1/σ_Y2=4.87). (Stress results have been normalized by the yield strength of each material, σ_Y.)

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Contours of von Mises equivalent stress for δ=2 nm, t=10 nm,E₁/E₂=0.88,σ_Y1/σ_Y2=2.12, and σ_R=−2 GPa

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Variation of (a) maximum von Mises equivalent stress, σ̄_M^max, (b) maximum equivalent plastic strain, ε̄_p^max, and (c) maximum first principal stress, σ₁^max, with maximum local surface interference δ in the overcoat medium for t=10 nm,E₁/E₂=0.88,σ_Y1/σ_Y2=2.12, and σ_R=0, −1, −2, and −4 GPa. (Stress results have been normalized by the yield strength of the overcoat, σ_Y1.)

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Variation of (a) maximum von Mises equivalent stress, σ̄_M^max, (b) maximum equivalent plastic strain, ε̄_p^max, and (c) maximum first principal stress, σ₁^max, with maximum local surface interference δ in the magnetic layer medium for t=10 nm,E₁/E₂=0.88,σ_Y1/σ_Y2=2.12, and σ_R=0, −1, −2, and −4 GPa. (Stress results have been normalized by the yield strength of the magnetic layer, σ_Y2.)

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Komvopoulos KK, Ye NN. Elastic-Plastic Finite Element Analysis for the Head-Disk Interface With Fractal Topography Description. ASME. J. Tribol. 2002;124(4):775-784. doi:10.1115/1.1467088.

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Elastic-Plastic Finite Element Analysis for the Head-Disk Interface With Fractal Topography Description

References

Figures

Finite element mesh of a layered medium with a 10 nm thick overcoat

Evolution of contact pressure distributions at different regions of the surface profile shown in Fig. 1(a) with increasing surface interference for t=2 nm,E₁/E₂=0.88, and σ_Y1/σ_Y2=2.12

Contours of (a), (c) von Mises equivalent stress and (b), (d) equivalent plastic strain for δ=0.5 nm, t=2 nm,E₁/E₂=0.88, and σ_Y1/σ_Y2=2.12

Contours of (a), (c) von Mises equivalent stress and (b), (d) equivalent plastic strain for δ=1 nm, t=2 nm,E₁/E₂=0.88, and σ_Y1/σ_Y2=2.12

Contours of (a), (c) von Mises equivalent stress and (b), (d) equivalent plastic strain for δ=2 nm, t=2 nm,E₁/E₂=0.88, and σ_Y1/σ_Y2=2.12

Contours of (a), (c) von Mises equivalent stress and (b), (d) equivalent plastic strain for δ=2 nm, t=5 nm,E₁/E₂=0.88, and σ_Y1/σ_Y2=2.12

Contours of (a), (c) von Mises equivalent stress and (b), (d) equivalent plastic strain for δ=2 nm, t=10 nm,E₁/E₂=0.88, and σ_Y1/σ_Y2=2.12

Contours of (a), (c) von Mises equivalent stress and (b), (d) equivalent plastic strain for δ=2 nm, t=5 nm,E₁/E₂=1.29, and σ_Y1/σ_Y2=4.87

Contours of von Mises equivalent stress for δ=2 nm, t=10 nm,E₁/E₂=0.88,σ_Y1/σ_Y2=2.12, and σ_R=−2 GPa

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Elastic-Plastic Finite Element Analysis for the Head-Disk Interface With Fractal Topography Description

References

Figures

Finite element mesh of a layered medium with a 10 nm thick overcoat

Evolution of contact pressure distributions at different regions of the surface profile shown in Fig. 1(a) with increasing surface interference for t=2 nm,E1/E2=0.88, and σY1/σY2=2.12

Contours of (a), (c) von Mises equivalent stress and (b), (d) equivalent plastic strain for δ=0.5 nm, t=2 nm,E1/E2=0.88, and σY1/σY2=2.12

Contours of (a), (c) von Mises equivalent stress and (b), (d) equivalent plastic strain for δ=1 nm, t=2 nm,E1/E2=0.88, and σY1/σY2=2.12

Contours of (a), (c) von Mises equivalent stress and (b), (d) equivalent plastic strain for δ=2 nm, t=2 nm,E1/E2=0.88, and σY1/σY2=2.12

Contours of (a), (c) von Mises equivalent stress and (b), (d) equivalent plastic strain for δ=2 nm, t=5 nm,E1/E2=0.88, and σY1/σY2=2.12

Contours of (a), (c) von Mises equivalent stress and (b), (d) equivalent plastic strain for δ=2 nm, t=10 nm,E1/E2=0.88, and σY1/σY2=2.12

Contours of (a), (c) von Mises equivalent stress and (b), (d) equivalent plastic strain for δ=2 nm, t=5 nm,E1/E2=1.29, and σY1/σY2=4.87

Contours of von Mises equivalent stress for δ=2 nm, t=10 nm,E1/E2=0.88,σY1/σY2=2.12, and σR=−2 GPa

Tables

Errata

Discussions

Related Content

Journals

Conference Proceedings

eBooks

Evolution of contact pressure distributions at different regions of the surface profile shown in Fig. 1(a) with increasing surface interference for t=2 nm,E₁/E₂=0.88, and σ_Y1/σ_Y2=2.12

Contours of (a), (c) von Mises equivalent stress and (b), (d) equivalent plastic strain for δ=0.5 nm, t=2 nm,E₁/E₂=0.88, and σ_Y1/σ_Y2=2.12

Contours of (a), (c) von Mises equivalent stress and (b), (d) equivalent plastic strain for δ=1 nm, t=2 nm,E₁/E₂=0.88, and σ_Y1/σ_Y2=2.12

Contours of (a), (c) von Mises equivalent stress and (b), (d) equivalent plastic strain for δ=2 nm, t=2 nm,E₁/E₂=0.88, and σ_Y1/σ_Y2=2.12

Contours of (a), (c) von Mises equivalent stress and (b), (d) equivalent plastic strain for δ=2 nm, t=5 nm,E₁/E₂=0.88, and σ_Y1/σ_Y2=2.12

Contours of (a), (c) von Mises equivalent stress and (b), (d) equivalent plastic strain for δ=2 nm, t=10 nm,E₁/E₂=0.88, and σ_Y1/σ_Y2=2.12

Contours of (a), (c) von Mises equivalent stress and (b), (d) equivalent plastic strain for δ=2 nm, t=5 nm,E₁/E₂=1.29, and σ_Y1/σ_Y2=4.87

Contours of von Mises equivalent stress for δ=2 nm, t=10 nm,E₁/E₂=0.88,σ_Y1/σ_Y2=2.12, and σ_R=−2 GPa