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TECHNICAL PAPERS

On the Surface Dimple Phenomena in Elliptical TEHL Contacts With Arbitrary Entrainment

[+] Author and Article Information
Jing Wang, Peiran Yang

Department of Mechanical Engineering, Qingdao Institute of Architecture and Engineering, Qingdao 266033, People’s Republic of China

Motohiro Kaneta, Hiroshi Nishikawa

Department of Mechanical and Control Engineering, Kyushu Institute of Technology, Kitakyushu 804-8550, Japan

J. Tribol 125(1), 102-109 (Dec 31, 2002) (8 pages) doi:10.1115/1.1494087 History: Received July 19, 2001; Revised April 18, 2002; Online December 31, 2002
Copyright © 2003 by ASME
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References

Figures

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Coordinate systems for contact ellipse with an arbitrary angle between the entraining vector and the minor axis
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Comparison between theoretical and experimental results, θ=0: (a) theory, Ue=8×10−11; and (b) experiment, uD=190 mm/s
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Film thickness contour maps and profiles obtained theoretically, θ=π/4: (a) Ue=6×10−11; (b) Ue=8×10−11; and (c) ue=13×10−11
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Interferograms and film profiles obtained experimentally, θ=π/4: (a) uD=140 mm/s; (b) uD=190 mm/s; and (c) uD=350 mm/s
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Comparison between theoretical and experimental results, θ=π/2: (a) theory; and (b) experiment    
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Film thickness contour maps for θ=π/8 and 3 π/8, Ue=8×10−11: (a) θ=π/8; and (b) θ=3 π/8
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Variation of film shape along the major axis of the contact ellipse versus entrainment angle, Ue=8×10−11: (a) 0≤θ≤π/4; and (b) π/4<θ≤π2
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Comparison of central film thickness versus entrainment angle θ: (a) Ue=8×10−11; and (b) Ue=16×10−11
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Comparison of minimum film thickness versus entrainment angle θ: Ue=8×10−11; and (b) Ue=16×10−11
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Temperature distributions in the middle layers of the films for (a) θ=0; (b) π/4; and (c) π/2: Ue=8×10−11
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Traction coefficient μ versus entrainment angle θ
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Schematic diagram of the experimental apparatus

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