Microstructural Characterization of Ti-6Al-4V Subjected to Fretting

[+] Author and Article Information
Dana R. Swalla, Richard W. Neu, David L. McDowell

The George W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, GA 30332-0405

J. Tribol 126(4), 809-816 (Nov 09, 2004) (8 pages) doi:10.1115/1.1792677 History: Received October 07, 2003; Revised March 15, 2004; Online November 09, 2004
Copyright © 2004 by ASME
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Grahic Jump Location
SEM micrograph of Ti-6A1-4V microstructure after etching
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Fretting apparatus used in experiments
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Frictional force (F) versus clip gage displacement (δ) hysteresis plots
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Schematic showing fretting scar orientation relative to plate
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SEM micrograph of Test 2 (δa=60 μm, N=1000): (a) near edge of fretting contact and (b) near center of fretting contact
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Nanoindentation test results on (a) Test 1 (δa=60 μm,N=105 cycles), and (b) Test 2 (δa=60 μm,N=103 cycles)
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Orientation map and pattern quality map for Test 1 (δ=±60 μm, N=105)
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Pole figures for (a) as-received cross section, (b) area away from fretting-disturbed region in Test 1 (δa=60 μm,N=105 cycles), and (c) area in fretting-disturbed region in Test 1
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Misorientation angle distribution in the fretting-disturbed region




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