0
TECHNICAL PAPERS

Assessment and Verification of a Novel Method for Near Surface Measurement of Mechanical Properties

[+] Author and Article Information
S. Ozcan, P. Filip

Department of Mechanical Engineering and Energy Processes, Center for Advanced Friction Studies,  Southern Illinois University at Carbondale, Carbondale, IL 62901

K. Farhang1

Department of Mechanical Engineering and Energy Processes, Center for Advanced Friction Studies,  Southern Illinois University at Carbondale, Carbondale, IL 62901farhang@siu.edu

1

Corresponding author.

J. Tribol 129(2), 314-320 (Jan 09, 2007) (7 pages) doi:10.1115/1.2540550 History: Received May 02, 2006; Revised January 09, 2007

A novel two-parameter area function for determination of near surface properties of Young’s modulus of elasticity and hardness has shown promise for compensating for the imperfection of the tip-end in an instrumented indentation measurement. This paper provides a comprehensive study involving a Berkovitch tip. The tip is utilized in an MTS nanoindentation measurement machine and is used to establish load indentation information for fused silica samples. The geometry of the tip is then characterized independently using a highly accurate atomic force microscope. Using the indentation data along with the two-parameter area function methodology, the tip-end radius of curvature is found to provide the most consistent value of modulus of elasticity. Independently, the data from the scanning electron microscope measurement of the same tip is used to obtain the least-squares estimation of the tip curvature. The two approaches yield favorable agreement in the estimation of tip-end radius of curvature. Therefore, the validity of the two-parameter area function method is proved. The method is shown to provide a robust, reliable, and accurate measurement of modulus of elasticity and hardness in the nanoscale proximity of a surface.

Copyright © 2007 by American Society of Mechanical Engineers
Your Session has timed out. Please sign back in to continue.

References

Figures

Grahic Jump Location
Figure 2

SEM image of a Berkovich tip showing submicron features

Grahic Jump Location
Figure 3

Schematic of the MTS Nano Indenter XP system

Grahic Jump Location
Figure 4

Scanned information by tapping mode on the Berkovich indenter near its tip-end

Grahic Jump Location
Figure 5

Stiffness∕depth data using CSM indentation technique

Grahic Jump Location
Figure 6

Stiffness∕depth measurement and its least-squares fit line and 90% confidence band (std=0.000385mN∕nm)

Grahic Jump Location
Figure 7

Percent error for a suitable radius of curvature and slope near tip-end; R=70nm and m=0.3576

Grahic Jump Location
Figure 8

Percent error for three tip-end radii of curvature and theoretical slope m=0.3576

Grahic Jump Location
Figure 9

Percent error corresponding to the lower 2-sigma bound for three tip-end radii of curvature and theoretical slope m=0.29

Grahic Jump Location
Figure 10

Percent error corresponding to the least-squares line for three tip-end radii of curvature and slope m=0.243

Grahic Jump Location
Figure 11

Percent error corresponding to the upper 2-sigma bound for three tip-end radii of curvature and theoretical slope m=0.255

Grahic Jump Location
Figure 12

Tip-end geometry by AFM measurement of the tip-end region

Grahic Jump Location
Figure 13

Two-dimensional contour plot of the tip-end region measured by AFM

Grahic Jump Location
Figure 14

The tip-end measured surface and the least-squares fit quadratic surface of revolution

Grahic Jump Location
Figure 15

The tip-end measured surface and the least-squares fit spherical surface

Grahic Jump Location
Figure 1

Berkovich indenter geometry and its coordinate system

Tables

Errata

Discussions

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related Journal Articles
Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In