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Research Papers

Influence of Surface Waviness on the Thermal Elastohydrodynamic Lubrication of an Eccentric-Tappet Pair

[+] Author and Article Information
J. Wang

School of Mechanical Engineering,
Qingdao Technological University,
Qingdao 266033, P.R.C.
e-mail: wj20011226@163.com

C. H. Venner

University of Twente,
Faculty of Engineering Technology,
Department of Engineering Fluid Dynamics,
Enschede 7500AE, The Netherlands
e-mail: C.H.Venner@utwente.nl

A. A. Lubrecht

Université de Lyon, INSA de Lyon,
UMR CNRS 5259,
Villeurbanne F69621, France
e-mail: ton.lubrecht@insa-lyon.fr

Contributed by the Tribology Division of ASME for publication in the JOURNAL OF TRIBOLOGY. Manuscript received July 20, 2012; final manuscript received December 25, 2012; published online March 18, 2013. Assoc. Editor: Xiaolan Ai.

J. Tribol 135(2), 021001 (Mar 18, 2013) (11 pages) Paper No: TRIB-12-1115; doi: 10.1115/1.4023410 History: Received July 20, 2012; Revised December 25, 2012

The effect of single-sided and double-sided harmonic surface waviness on the film thickness, pressure, and temperature oscillations in an elastohydrodynamically lubricated eccentric-tappet pair has been investigated in relation to the eccentricity and the waviness wavelength. The results show that, during one working cycle, the waviness causes significant fluctuations of the oil film, pressure, and temperature, as well as a reduction in minimum film thickness. Smaller wavelength causes more dramatic variations in oil film. The fluctuations of the pressure, film thickness, temperature, and traction coefficient caused by double-sided waviness are nearly the same compared with the single-sided waviness, but the variations are less intense.

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References

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Figures

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Fig. 1

Schematic diagram of an eccentric-tappet pair: (a) original; (b) equivalent

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Fig. 2

Variations of dimensionless load with eccentricities over a working cycle

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Fig. 3

Variations of dimensionless entrainment velocity with eccentricity over a working cycle

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Fig. 4

Variation of the central pressure over one period, Ab = 0.2 μm, Lb = 240 μm

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Fig. 5

Pressure and film thickness profiles at T = 0.5, Ab = 0.2 μm, Lb = 240 μm

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Fig. 6

Temperature rise profiles at T = 0.5, Ab = 0.2 μm, Lb = 240 μm

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Fig. 7

Variation of the minimum film thickness over one period, Ab = 0.2 μm, Lb = 240 μm

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Fig. 8

Variation of the maximum temperature over one period, Ab = 0.2 μm, Lb = 240 μm

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Fig. 9

Variation of the traction coefficient over one period, Ab = 0.2 μm, Lb = 240 μm

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Fig. 10

Variation of the central pressure versus roughness wavelength

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Fig. 11

Variation of the central pressure versus roughness wavelength, Ab = 0.2 μm, e = 0.04 m

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Fig. 12

Variation of the central pressure over one period with double-sided waviness, Aa = Ab = 0.1 μm, La = Lb = 240 μm

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Fig. 13

Variation of the maximum temperature over one period with double-sided waviness, Aa = Ab = 0.1 μm, La = Lb = 240 μm

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Fig. 14

Variation of the central pressure over one period with double-sided waviness, Aa = Ab = 0.1 μm, La = Lb = 120 μm

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