0
Research Papers: Applications

Laser Reflection as a Simple Prospect Tool for Nondestructive Quality Control of Charged Lapping Plates

[+] Author and Article Information
Rodrigo Mayen-Mondragon

Facultad de Química,
Polo Universitario de Tecnología Avanzada,
Universidad Nacional Autónoma de México,
Vía de la Innovación No. 410,
Autopista MTY-Aeropuerto Km. 10, PIIT,
Apodaca 66629, Nuevo León, México
e-mail: rmayen@unam.mx

Carlos Alberto Avila-Herrera

Centro de Investigación y de Estudios
Avanzados del I.P.N.,
Unidad Querétaro,
Libramiento Norponiente No. 2000,
Fracc. Real de Juriquilla,
Querétaro 76230, Querétaro, México
e-mail: cavila@cinvestav.mx

Alberto Herrera-Gomez

Centro de Investigación y de Estudios
Avanzados del I.P.N.,
Unidad Querétaro,
Libramiento Norponiente No. 2000,
Fracc. Real de Juriquilla,
Querétaro 76230, Querétaro, México
e-mail: aherrerag@cinvestav.mx

Jose Martin Yanez-Limon

Centro de Investigación y de Estudios
Avanzados del I.P.N.,
Unidad Querétaro,
Libramiento Norponiente No. 2000,
Fracc. Real de Juriquilla,
Querétaro 76230, Querétaro, México
e-mail: jmyanez@cinvestav.mx

Rafael Ramirez-Bon

Centro de Investigación y de Estudios
Avanzados del I.P.N.,
Unidad Querétaro,
Libramiento Norponiente No. 2000,
Fracc. Real de Juriquilla,
Querétaro 76230, Querétaro, México
e-mail: rrbon@cinvestav.mx

1Corresponding author.

Contributed by the Tribology Division of ASME for publication in the JOURNAL OF TRIBOLOGY. Manuscript received November 5, 2015; final manuscript received July 13, 2016; published online October 27, 2016. Assoc. Editor: Robert L. Jackson.

J. Tribol 139(2), 021101 (Oct 27, 2016) (6 pages) Paper No: TRIB-15-1396; doi: 10.1115/1.4034249 History: Received November 05, 2015; Revised July 13, 2016

In the present work, a simple laser/detector-based system was assembled and mounted in situ at the production line of the Hitachi hard-disk recording-head facilities in Mexico. The system was set to scan the surface of rotating lapping plates charged during time windows of varying lengths. The specular-reflection component was measured as a function of angular distance along the plate surface. The optical system showed enough sensitivity to follow the incorporation of abrasive into the plate surface. Moreover, two different charging stages were identified. Relevant topographical information could also be extracted. For example, the data distribution skewness was used to identify major surface defects, such as scratches. The reflection-signal spatial pattern was matched to that of the lapping plate topographer (LPT) surface profile by means of a coherence-spectrum analysis. The system assembly is relatively straightforward and it occupies little space. Thus, it could become a compact multitask substitute or complement of larger equipment at the manufacturing line. Note that even when the data analysis performed has led to promising results, the technique still needs to be fine-tuned in order to increase its precision and reliability.

FIGURES IN THIS ARTICLE
<>
Copyright © 2017 by ASME
Your Session has timed out. Please sign back in to continue.

References

Figures

Grahic Jump Location
Fig. 1

Assembled reflection-system main components: A—photodetector, B—diode laser, C—measuring head, D—lapping plate, E—step motor, F—positioning screw, G—linear unislide, H—rotary table, and I—adjusting screws

Grahic Jump Location
Fig. 2

Average specular-reflection response of the lapping plate surface as a function of charging time: A— “flattening” stage and B— “boosted-charging” stage

Grahic Jump Location
Fig. 3

(a) Comparison between the reflection-signal pattern, at a fixed radial position, of a charged lapping plate (A) and the LPT-topographic-profile of the same plate before charging (B). (b) Coherence spectrum of the reflection signal and LPT-topographic-profile of the plate.

Grahic Jump Location
Fig. 4

(a) Comparison between reflection-signal patterns, at a fixed radial position, of a scratched (A) and a good (B) charged plate. (b) Scratched-plate reflection-data skewed histogram.

Tables

Errata

Discussions

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related Journal Articles
Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In