0
Technical Brief

Investigations of the adhesive contact behavior of elastic layered media with surface roughness

[+] Author and Article Information
Yuyan Zhang

Department of Mechanical and Electrical Engineering, Nanjing Forestry University, Nanjing 210037, China
yuyan_zhang@njfu.edu.cn

Lina Si

Department of Mechanical and Materials Engineering, North China University of Technology, Beijing 100144, China
silina_thu@163.com

XiaoQing Zhang

Department of Materials Science and Mechanical Engineering, Beijing Technology and Business University, Beijing 100048, China
xiaogear11@163.com

Juan Li

Department of Mechanical and Electrical Engineering, Nanjing Forestry University, Nanjing 210037, China
lijuan87@njfu.edu.cn

Wanjun Wang

Department of Mechanical and Electrical Engineering, Nanjing Forestry University, Nanjing 210037, China
freepxyang@126.com

1Corresponding author.

ASME doi:10.1115/1.4042505 History: Received July 26, 2018; Revised December 27, 2018

Abstract

A deterministic adhesive model for the contact between an elastic layered medium with surface roughness and a smooth elastic microsphere was developed on the basis of the Lennard-Jones surface force law. Through numerical simulations, the adhesive contact behavior of the layered medium with the measured three-dimensional surface topography was comparatively analyzed with that of the homogeneous medium. Furthermore, the contact characteristics of the layered medium with pre-assigned roughness parameters were investigated with the aid of a computer-generated technique for simulating surface roughness. Results showed that the pull-off force for the contact problem involving rough surfaces was influenced by the contact location, and the average value for the contact between an alumina (SiO2) microsphere and a diamond-like carbon/silicon (DLC/Si) layered medium was smaller than that for the contact between a SiO2 microsphere and a Si homogeneous half-space. In addition, the effect of the DLC layer on reducing adhesion was smaller than that of the surface roughness. Finally, the average pull-off force for a DLC/Si layered medium with computer-generated surface roughness rapidly decreased; however, it eventually became almost unchangeable with the increase in the root-mean-square (RMS) deviation.

Copyright (c) 2019 by ASME
Your Session has timed out. Please sign back in to continue.

References

Figures

Tables

Errata

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related Journal Articles
Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In