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  • Proceedings Article January 01, 2011

    Daniel J. Burbridge; Sebastian Howell-Smith; Mircea S. Teodorescu

    Proc. ASME. 54846; Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference:401-404.January 01, 2011
    DETC2011-47856
    doi: 10.1115/DETC2011-47856