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Proceedings Papers

Internal Porosity Detection in Additively Manufactured Parts via Electromechanical Impedance Measurements

Charles Tenney, Mohammad I. Albakri, Joseph Kubalak, Logan D. Sturm, Christopher B. Williams, Pablo A. Tarazaga
Proc. ASME. SMASIS2017, Volume 1: Development and Characterization of Multifunctional Materials; Mechanics and Behavior of Active Materials; Bioinspired Smart Materials and Systems; Energy Harvesting; Emerging Technologies, V001T08A009, September 18–20, 2017
Paper No: SMASIS2017-3856
DOI: https://doi.org/10.1115/SMASIS2017-3856
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Topics: Additive manufacturing, Porosity, Nondestructive evaluation, Quality control, Semiconductor wafers, Actuators, Impedance (Electricity), Mechanical impedance, Piezoelectric materials, Sensors
Proceedings Papers

Conformal Growth of Textured Barium Titanate Films on Patterned Silicon Wafer

Zhi Zhou, Brendan A. Patterson, Christopher C. Bowland, Mohammad H. Malakooti, Henry A. Sodano
Proc. ASME. SMASIS2016, Volume 1: Multifunctional Materials; Mechanics and Behavior of Active Materials; Integrated System Design and Implementation; Structural Health Monitoring, V001T01A002, September 28–30, 2016
Paper No: SMASIS2016-9073
DOI: https://doi.org/10.1115/SMASIS2016-9073
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Topics: Architecture, Crystals, Design, Manufacturing, Microelectromechanical systems, Microscopy, Nanowires, Scanning electron microscopy, Semiconductor wafers, Sensors
Proceedings Papers

Reduced Radius of Curvature Nitinol-on-Pt Bimorph Actuators Based on Reversible Shape Memory Effect

Cory R. Knick, Gabriel L. Smith, Merric D. Srour, Christopher J. Morris
Proc. ASME. SMASIS2016, Volume 1: Multifunctional Materials; Mechanics and Behavior of Active Materials; Integrated System Design and Implementation; Structural Health Monitoring, V001T01A003, September 28–30, 2016
Paper No: SMASIS2016-9081
DOI: https://doi.org/10.1115/SMASIS2016-9081
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Topics: Actuators, Nickel titanium alloys, Shape memory effects, Cantilevers, Semiconductor wafers, Microelectromechanical systems, Phase transitions, Stress, Crystallization, Design
Proceedings Papers

Material and Process Development of Thin Film Shape Memory Alloy for MEMS Actuator

Cory R. Knick, Christopher J. Morris
Proc. ASME. SMASIS2015, Volume 1: Development and Characterization of Multifunctional Materials; Mechanics and Behavior of Active Materials; Modeling, Simulation and Control of Adaptive Systems, V001T01A001, September 21–23, 2015
Paper No: SMASIS2015-8801
DOI: https://doi.org/10.1115/SMASIS2015-8801
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Topics: Actuators, Microelectromechanical systems, Shape memory thin films, Cantilevers, Semiconductor wafers, Phase transitions, Design, Differential scanning calorimetry, Heating, Manufacturing
Proceedings Papers

Fluidic Flexible Matrix Composites for Volume Management in Prosthetic Sockets

Melina Mercier, Corin Shirley, Shelby Stafford, Sydney Hitzke, Achu Byju, Chris Kevorkian, Michael Madigan, Michael Philen
Proc. ASME. SMASIS2014, Volume 2: Mechanics and Behavior of Active Materials; Integrated System Design and Implementation; Bioinspired Smart Materials and Systems; Energy Harvesting, V002T06A015, September 8–10, 2014
Paper No: SMASIS2014-7706
DOI: https://doi.org/10.1115/SMASIS2014-7706
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Topics: Artificial limbs, Composite materials, Prostheses, Reservoirs, Semiconductor wafers, Fluctuations (Physics), Fluid dynamics, Fluids, Skin, Soft tissues
Proceedings Papers

Modeling and Experimentation of Thickness Mode E/M Impedance and Rayleigh Wave Propagation for Piezoelectric Wafer Active Sensors on Thick Plates

Tuncay Kamas, Victor Giurgiutiu, Bin Lin
Proc. ASME. SMASIS2014, Volume 1: Development and Characterization of Multifunctional Materials; Modeling, Simulation and Control of Adaptive Systems; Structural Health Monitoring; Keynote Presentation, V001T05A003, September 8–10, 2014
Paper No: SMASIS2014-7571
DOI: https://doi.org/10.1115/SMASIS2014-7571
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Topics: Modeling, Plates (structures), Rayleigh waves, Semiconductor wafers, Sensors, Waves, Elastic plates, Experimental analysis, Inspection, Nondestructive evaluation
Proceedings Papers

Piezo-Optical Active Sensing With PWAS and FBG Sensors for Structural Health Monitoring

Bin Lin, Victor Giurgiutiu
Proc. ASME. SMASIS2014, Volume 1: Development and Characterization of Multifunctional Materials; Modeling, Simulation and Control of Adaptive Systems; Structural Health Monitoring; Keynote Presentation, V001T05A004, September 8–10, 2014
Paper No: SMASIS2014-7581
DOI: https://doi.org/10.1115/SMASIS2014-7581
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Topics: Fiber Bragg gratings, Sensors, Structural health monitoring, Calibration, Composite materials, Damage, Design, Echoes, Electromagnetic interference, Energy transformation
Proceedings Papers

Effects of Rapid Change in Temperature on Ultrasonic Guided Lamb Wave Propagation

Balaji Sivasubramanian, Daewon Kim
Proc. ASME. SMASIS2013, Volume 2: Mechanics and Behavior of Active Materials; Structural Health Monitoring; Bioinspired Smart Materials and Systems; Energy Harvesting, V002T05A011, September 16–18, 2013
Paper No: SMASIS2013-3173
DOI: https://doi.org/10.1115/SMASIS2013-3173
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Topics: Temperature, Wave propagation, Waves, Sensors, Adhesives, Aircraft, Aluminum, Composite building materials, Cooling, Cycles
Proceedings Papers

Multimodal Lamb Waves Power and Transfer Function Analysis of Structurally-Bonded PWAS

Bin Lin, Ayman Kamal, Victor Giurgiutiu, Tuncay Kamas
Proc. ASME. SMASIS2012, Volume 1: Development and Characterization of Multifunctional Materials; Modeling, Simulation and Control of Adaptive Systems; Structural Health Monitoring, 765-771, September 19–21, 2012
Paper No: SMASIS2012-8061
DOI: https://doi.org/10.1115/SMASIS2012-8061
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Topics: Transfer functions, Waves, Modeling, Structural health monitoring, Approximation, Frequency response, Physics, Semiconductor wafers, Sensors, Space frame structures
Proceedings Papers

Simulation of Interaction Between Lamb Waves and Cracks for Structural Health Monitoring With Piezoelectric Wafer Active Sensors

Yanfeng Shen, Victor Giurgiutiu
Proc. ASME. SMASIS2012, Volume 1: Development and Characterization of Multifunctional Materials; Modeling, Simulation and Control of Adaptive Systems; Structural Health Monitoring, 615-623, September 19–21, 2012
Paper No: SMASIS2012-7917
DOI: https://doi.org/10.1115/SMASIS2012-7917
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Topics: Fracture (Materials), Semiconductor wafers, Sensors, Simulation, Structural health monitoring, Waves, Damage, Aluminum plate, Collisions (Physics), Excitation
Proceedings Papers

Electromechanical Impedance Modeling for Structural Health Monitoring

Liuxian Zhao, Lingyu Yu, Mattieu Gresil, Michael Sutton, Siming Guo
Proc. ASME. SMASIS2012, Volume 1: Development and Characterization of Multifunctional Materials; Modeling, Simulation and Control of Adaptive Systems; Structural Health Monitoring, 783-790, September 19–21, 2012
Paper No: SMASIS2012-8094
DOI: https://doi.org/10.1115/SMASIS2012-8094
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Topics: Modeling, Structural health monitoring, Finite element methods, Aluminum, Impedance (Electricity), Mechanical impedance, Piezoelectric materials, Sensors, Composite materials, Damage
Proceedings Papers

Design, Development, and Assembly of Space Flight Structural Health Monitoring Experiment

David Siler, Ben Cooper, Chris White, Stephen Marinsek, Andrei Zagrai, Joe MacGillivray, Jaclene Gutierrez, Karen Tena, Levi Magnuson, Lloyd Puckett, Jordan Klepper, Anders Jorgensen, Seth Kessler
Proc. ASME. SMASIS2012, Volume 1: Development and Characterization of Multifunctional Materials; Modeling, Simulation and Control of Adaptive Systems; Structural Health Monitoring, 903-906, September 19–21, 2012
Paper No: SMASIS2012-8239
DOI: https://doi.org/10.1115/SMASIS2012-8239
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Topics: Design, Manufacturing, Space flight, Structural health monitoring, Flight, Hardware, Rockets, Sensors, Wave propagation, Bolted joints
Proceedings Papers

Influence of Sensor Statistics on Piezoelectric and Magneto-Elastic Damage Detection

David Conrad, Andrei Zagrai, Daniel Meisner
Proc. ASME. SMASIS2012, Volume 1: Development and Characterization of Multifunctional Materials; Modeling, Simulation and Control of Adaptive Systems; Structural Health Monitoring, 925-933, September 19–21, 2012
Paper No: SMASIS2012-8255
DOI: https://doi.org/10.1115/SMASIS2012-8255
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Topics: Damage, Sensors, Statistics, Membrane electrode assemblies, Structural health monitoring, Aerospace industry, Boundary-value problems, Echoes, Geometry, Semiconductor wafers
Proceedings Papers

Wireless Excitation and Electrical Impedance Matching of Piezoelectric Wafer Active Sensors

Rashed Hossain Bhuiyan, MD Mazharul Islam, Haiying Huang
Proc. ASME. SMASIS2012, Volume 2: Mechanics and Behavior of Active Materials; Integrated System Design and Implementation; Bio-Inspired Materials and Systems; Energy Harvesting, 271-276, September 19–21, 2012
Paper No: SMASIS2012-8210
DOI: https://doi.org/10.1115/SMASIS2012-8210
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Topics: Excitation, Impedance (Electricity), Semiconductor wafers, Sensors, Enterprise information management, Circuits, Ultrasound, Inspection, Simulation, Structural health monitoring
Proceedings Papers

Evolution of Linear Moduli and Nonlinear Responses of a PZT Wafer Under Electric Field at Room and High Temperatures

Najae Lee, Dae Won Ji, Sang-joo Kim, Yong Soo Kim
Proc. ASME. SMASIS2012, Volume 2: Mechanics and Behavior of Active Materials; Integrated System Design and Implementation; Bio-Inspired Materials and Systems; Energy Harvesting, 125-131, September 19–21, 2012
Paper No: SMASIS2012-8012
DOI: https://doi.org/10.1115/SMASIS2012-8012
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Topics: Electric fields, High temperature, Semiconductor wafers, Polarization (Electricity), Polarization (Light), Polarization (Waves), Temperature, Cycles, Displacement, Electrical properties
Proceedings Papers

Predictive Modeling of Space Structures for SHM With PWAS Transducers

Matthieu Gresil, Bin Lin, Yanfeng Shen, Victor Giurgiutiu
Proc. ASME. SMASIS2011, ASME 2011 Conference on Smart Materials, Adaptive Structures and Intelligent Systems, Volume 2, 525-534, September 18–21, 2011
Paper No: SMASIS2011-5190
DOI: https://doi.org/10.1115/SMASIS2011-5190
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Topics: Modeling, Space frame structures, Structural health monitoring, Transducers, Finite element methods, Waves, Nondestructive evaluation, Wave propagation, Computer software, Damage
Proceedings Papers

Polypyrrole Bridge as a Support for Alamethicin-Reconstituted Planar Bilayer Lipid Membranes

Robert Northcutt, Vishnu-Baba Sundaresan, Sergio Salinas, Hao Zhang
Proc. ASME. SMASIS2011, ASME 2011 Conference on Smart Materials, Adaptive Structures and Intelligent Systems, Volume 2, 613-620, September 18–21, 2011
Paper No: SMASIS2011-5015
DOI: https://doi.org/10.1115/SMASIS2011-5015
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Topics: Bridges (Structures), Membranes, Conducting polymers, Manufacturing, Polymers, Proteins, Active materials, Actuators, Electrochemical impedance spectroscopy, Electrochemical reactions
Proceedings Papers

Simultaneous Energy Harvesting and Gust Alleviation for a Multifunctional Wing Spar Using Reduced Energy Control Laws via Piezoceramics

Ya Wang, Daniel J. Inman
Proc. ASME. SMASIS2011, ASME 2011 Conference on Smart Materials, Adaptive Structures and Intelligent Systems, Volume 1, 211-220, September 18–21, 2011
Paper No: SMASIS2011-5224
DOI: https://doi.org/10.1115/SMASIS2011-5224
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Topics: Energy harvesting, Piezoelectric ceramics, Wing spars, Unmanned aerial vehicles, Amperes, Feedback, Flight, Semiconductor wafers, Vibration, Wind
Proceedings Papers

Computational Setup of Structural Health Monitoring for Real-Time Thermal Verification

Derek Doyle, Whitney Reynolds, Brandon Arritt, Brenton Taft
Proc. ASME. SMASIS2011, ASME 2011 Conference on Smart Materials, Adaptive Structures and Intelligent Systems, Volume 2, 447-453, September 18–21, 2011
Paper No: SMASIS2011-4991
DOI: https://doi.org/10.1115/SMASIS2011-4991
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Topics: Structural health monitoring, Manufacturing, Sensors, Cantilever beams, Inspection, Satellites, Semiconductor wafers, Space vehicles, Testing, Thermal properties
Proceedings Papers

Impact Detection Using an Array of Piezoelectric Wafer Active Sensors and a Microcontroller Unit

Abraham Light-Marquez, Andrei Zagrai
Proc. ASME. SMASIS2010, ASME 2010 Conference on Smart Materials, Adaptive Structures and Intelligent Systems, Volume 2, 719-726, September 28–October 1, 2010
Paper No: SMASIS2010-3823
DOI: https://doi.org/10.1115/SMASIS2010-3823
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Topics: Semiconductor wafers, Sensors, Sensor networks, Structural health monitoring, Algorithms, Aluminum plate, Damage, Embedded systems, Impact testing, Signal processing