Multigrid, An Alternative Method for Calculating Film Thickness and Pressure Profiles in Elastohydrodynamically Lubricated Line Contacts

[+] Author and Article Information
A. A. Lubrecht, W. E. ten Napel, R. Bosma

Twente University of Technology, Enschede, The Netherlands

J. Tribol 108(4), 551-556 (Oct 01, 1986) (6 pages) doi:10.1115/1.3261260 History: Received October 18, 1985; Online October 29, 2009


Film thickness and pressure profiles have been calculated for line contacts at moderate and high loads, using a Multigrid method. Influence of the compressibility of the lubricant on the minimum film thickness and on the pressure spike has been examined. The required computing time is an order of magnitude less than when using the previous methods.

Copyright © 1986 by ASME
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