Transient Analysis of Surface Features in an EHL Line Contact in the Case of Sliding

[+] Author and Article Information
C. H. Venner

University of Twente, Enschede, The Netherlands

A. A. Lubrecht

SKF Engineering & Research Centre BV, Nieuwegein, The Netherlands

J. Tribol 116(2), 186-193 (Apr 01, 1994) (8 pages) doi:10.1115/1.2927195 History: Received February 13, 1992; Online June 05, 2008


This paper investigates in detail the influence of two different surface topographies on the pressure distribution and film thickness profile of a highly loaded (maximum Hertzian pressure 2 GPa) line contact as a function of the slide to roll ratio. To accomplish this the transient Reynolds equation is solved both in space and time. The first feature under investigation is localized, a so-called indentation, the second one is global: waviness. The observed lack of synchronism in the extremes of pressure and film thickness is explained theoretically by analyzing the Reynolds equation. The minimum and average film thickness values in case of waviness are analyzed as a function of the slide to roll ratio, amplitude, and wavelength. Depending on the slide to roll ratio, the transient solutions may differ significantly from their stationary counterparts. In such cases, therefore, a transient analysis cannot be avoided.

Copyright © 1994 by The American Society of Mechanical Engineers
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