Elastohydrodynamic Film Thickness Model for Heavily Loaded Contacts

[+] Author and Article Information
S. H. Loewenthal

U.S. Army Air Mobility R&D Laboratory, NASA Lewis Research Center, Cleveland, Ohio

R. J. Parker, E. V. Zaretsky

NASA Lewis Research Center, Cleveland, Ohio

J. of Lubrication Tech 96(3), 472-479 (Jul 01, 1974) (8 pages) doi:10.1115/1.3452011 History: Received July 09, 1973; Online October 18, 2010


An empirical elastohydrodynamic (EHD) film thickness formula for predicting the minimum film thickness occurring within heavily loaded contacts (maximum Hertz stresses above 1.04 × 109 N/m2 (150,000 psi)) was developed. The formula was based upon X-ray film thickness measurements made with synthetic paraffinic, fluorocarbon, Type II ester and polyphenyl ether fluids covering a wide range of test conditions. Comparisons were made between predictions from an isothermal EHD theory and the test data. The deduced relationship was found to adequately reflect the high-load dependence exhibited by the measured data. The effects of contact geometry, material and lubricant properties on the form of the empirical model are also discussed.

Copyright © 1974 by ASME
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