A Statistical Model on Drive-Level Stiction

[+] Author and Article Information
H. Tang, J. Gui

Seagate Technology, 47010 Kato Road, Fremont, CA 94538

J. Tribol 121(4), 933-938 (Oct 01, 1999) (6 pages) doi:10.1115/1.2834158 History: Received January 16, 1998; Revised July 14, 1998; Online January 24, 2008


We present a statistical model that correlates the drive-level stiction behavior, which involves multiple head-disk interfaces, to its constituentsrsquo; component-level stiction behavior. The model takes into account all types of component-level stiction events, namely fly stiction as well as normal stiction. The important conclusions from this study are as follows, (i) Drives with a large number of head-disk interfaces are significantly more immune to stiction induced spin failure than one might perceive. (ii) The stiction per interface measured in a drive is always lower than the component-level stiction and decreases with increasing number of head-disk interfaces.

Copyright © 1999 by The American Society of Mechanical Engineers
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