Flyability Failures Due to Organic Siloxanes at the Head/Disk Interface

[+] Author and Article Information
Vedantham Raman, Donald Gillis, Reinhard Wolter

IBM Storage Systems Division, San Jose, CA 95193

J. Tribol 122(2), 444-449 (Jun 30, 1999) (6 pages) doi:10.1115/1.555380 History: Received February 08, 1999; Revised June 30, 1999
Copyright © 2000 by ASME
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Variation of capacitance as a function of time for head-disk interface in the absence of siloxane contamination
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Micrographs showing absence of contamination on slider tested in the absence of siloxane contamination
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The variation of capacitance with time for a head-disk interface pair tested in the presence of octamethylcyclotetrasiloxane. The interface failed after about 2800 minutes of testing.
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(a) and (b) show details of the changes in ID and OD capacitance values immediately preceding failure. Capacitance shows rapid changes following failure.
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Micrographs show a crashed slider due to silica formation at the head-disk interface.
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Variation of capacitance with time at the point of failure and beyond for a head-disk interface pair. Tests were conducted in the presence of siloxane atmosphere.
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(a)–(d) Photographs showing features on the slider from a test with exposed adhesive tape. This slider showed a change in flying height of about 7.0 pF (20 nm drop in flying height).
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Plot showing variation of transmittance versus wave numbers identifying silica formation on slider surface. The two traces correspond to the two materials used in this study.
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Variation of capacitance as a function of time for an X-1P lubricated disk in the presence of siloxane source. No drastic changes in the capacitance of the slider are observed.



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