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Issues
March 2016
ISSN 1043-7398
EISSN 1528-9044
In this Issue
Editorial
Special Section on InterPACK 2015
J. Electron. Packag. March 2016, 138(1): 010201.
doi: https://doi.org/10.1115/1.4032748
Topics:
Packaging
,
Thermal analysis
,
Electronic packaging
,
Electronics
,
Microchannels
,
Fluids
,
Printed circuit boards
Research Papers
Dynamic Numerical Microchannel Evaporator Model to Investigate Parallel Channel Instabilities
J. Electron. Packag. March 2016, 138(1): 010901.
doi: https://doi.org/10.1115/1.4032490
Topics:
Flow (Dynamics)
,
Heat conduction
,
Microchannels
,
Algorithms
,
Simulation
,
Stability
Experimental Characterization of the Vertical and Lateral Heat Transfer in Three-Dimensional Stacked Die Packages
J. Electron. Packag. March 2016, 138(1): 010902.
doi: https://doi.org/10.1115/1.4032346
A Method for Thermal Performance Characterization of Ultrathin Vapor Chambers Cooled by Natural Convection
J. Electron. Packag. March 2016, 138(1): 010903.
doi: https://doi.org/10.1115/1.4032345
Topics:
Calibration
,
Condensers (steam plant)
,
Copper
,
Flat heat pipes
,
Heat
,
Heat losses
,
Natural convection
,
Temperature
,
Thermal resistance
,
Vapors
Molecular Dynamics Study on Explosive Boiling of Thin Liquid Argon Film on Nanostructured Surface Under Different Wetting Conditions
J. Electron. Packag. March 2016, 138(1): 010904.
doi: https://doi.org/10.1115/1.4032463
Topics:
Boiling
,
Explosives
,
Molecular dynamics
,
Simulation
,
Temperature
,
Vapors
,
Wetting
,
Density
,
Equilibrium (Physics)
,
Heat flux
Gas–Liquid Flow Dispersion in Micro-Orifices and Bubble Coalescence With High Flow Rates
J. Electron. Packag. March 2016, 138(1): 010905.
doi: https://doi.org/10.1115/1.4032557
Topics:
Bubbles
,
Flow (Dynamics)
,
Orifices
Lid-Integral Cold-Plate Topology: Integration, Performance, and Reliability
Gerd Schlottig, Marco de Fazio, Werner Escher, Paola Granatieri, Vijayeshwar D. Khanna, Thomas Brunschwiler
J. Electron. Packag. March 2016, 138(1): 010906.
doi: https://doi.org/10.1115/1.4032493
Thermal Modeling of Extreme Heat Flux Microchannel Coolers for GaN-on-SiC Semiconductor Devices
Hyoungsoon Lee, Damena D. Agonafer, Yoonjin Won, Farzad Houshmand, Catherine Gorle, Mehdi Asheghi, Kenneth E. Goodson
J. Electron. Packag. March 2016, 138(1): 010907.
doi: https://doi.org/10.1115/1.4032655
Microfeature Heat Exchanger Using Variable-Density Arrays for Near-Isothermal Cold-Plate Operation
J. Electron. Packag. March 2016, 138(1): 010908.
doi: https://doi.org/10.1115/1.4032347
Topics:
Convection
,
Density
,
Flow (Dynamics)
,
Heat
,
Heat exchangers
,
Heat transfer
,
Hydrofoil
,
Pressure drop
,
Temperature
,
Water
Modeling Thermal Microspreading Resistance in Via Arrays
J. Electron. Packag. March 2016, 138(1): 010909.
doi: https://doi.org/10.1115/1.4032348
Three-Dimensional Integrated Circuit With Embedded Microfluidic Cooling: Technology, Thermal Performance, and Electrical Implications
Xuchen Zhang, Xuefei Han, Thomas E. Sarvey, Craig E. Green, Peter A. Kottke, Andrei G. Fedorov, Yogendra Joshi, Muhannad S. Bakir
J. Electron. Packag. March 2016, 138(1): 010910.
doi: https://doi.org/10.1115/1.4032496
Topics:
Cooling
,
Design
,
Fins
,
Flow (Dynamics)
,
Heat flux
,
Heat sinks
,
Heat transfer coefficients
,
Microfluidics
,
Temperature
,
Testing
Benchmarking Study on the Thermal Management Landscape for Three-Dimensional Integrated Circuits: From Back-Side to Volumetric Heat Removal
J. Electron. Packag. March 2016, 138(1): 010911.
doi: https://doi.org/10.1115/1.4032492
Topics:
Cooling
,
Fluids
,
Heat
,
Thermal management
,
Silicon
,
Microchannels
A Holistic Evaluation of Data Center Water Cooling Total Cost of Ownership
J. Electron. Packag. March 2016, 138(1): 010912.
doi: https://doi.org/10.1115/1.4032494
Topics:
Cooling
,
Data centers
,
Hardware
,
Water
Durability of Low Melt Alloys as Thermal Interface Materials
Chandan K. Roy, Sushil Bhavnani, Michael C. Hamilton, R. Wayne Johnson, Roy W. Knight, Daniel K. Harris
J. Electron. Packag. March 2016, 138(1): 010913.
doi: https://doi.org/10.1115/1.4032462
Topics:
Alloys
,
Thermal resistance
,
Disks
,
Copper
,
Wetting
,
Reliability
,
Cycles
Influence of Secondary Impact on Printed Wiring Assemblies—Part I: High-Frequency “Breathing Mode” Deformations in the Printed Wiring Board
J. Electron. Packag. March 2016, 138(1): 010914.
doi: https://doi.org/10.1115/1.4032495
Topics:
Damping
,
Printed circuit boards
,
Microbeams
Analysis of ZnO Thin Film as Thermal Interface Material for High Power Light Emitting Diode Application
J. Electron. Packag. March 2016, 138(1): 011001.
doi: https://doi.org/10.1115/1.4032029
Relationship Between the Intermetallic Compounds Growth and the Microcracking Behavior of Lead-Free Solder Joints
J. Electron. Packag. March 2016, 138(1): 011002.
doi: https://doi.org/10.1115/1.4032349
Topics:
Failure mechanisms
,
Solder joints
,
Solders
,
Surface roughness
,
Lead-free solders
,
Intermetallic compounds
,
Tensile strength
,
Microcracks
,
Tin
Analytical Solution for Electronic Assemblies Under Vibration
J. Electron. Packag. March 2016, 138(1): 011003.
doi: https://doi.org/10.1115/1.4032497
Topics:
Finite element analysis
,
Mode shapes
,
Solder joints
,
Solders
,
Stiffness
,
Stress
,
Vibration
,
Manufacturing
,
Deflection
,
Modal analysis
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Sequential Versus Concurrent Effects in Combined Stress Solder Joint Reliability
J. Electron. Packag
Anand Model Constants of Sn-Ag-Cu Solders: What Do They Actually Mean?
J. Electron. Packag